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STK12C68-5 (SMD5962-94599)
Document Number: 001-51026 Rev. ** Page 8 of 18
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 100 Years
NV
C
Nonvolatile STORE Operations 1,000 K
Capacitance
In the following table, the capacitance parameters are listed.
[6]
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 0 to 3.0 V
8pF
C
OUT
Output Capacitance 7pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
[6]
Parameter Description Test Conditions 28-CDIP 28-LCC Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
TBD TBD °C/W
Θ
JC
Thermal Resistance
(Junction to Case)
TBD TBD °C/W
Figure 7. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 963Ω
R2
512Ω
5.0V
Output
5 pF
R1 963
Ω
R2
512
Ω
For Tri-state Specs
Input Pulse Levels....................................................0V to 3V
Input Rise and Fall Times (10% to 90%)...................... <
5 ns
Input and Output Timing Reference Levels.......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
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