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SCPI Commands for the Counter
VX4101A MultiPaq Instrument User Manual
3–113
TEST Subsystem
The TEST subsystem handles the self test operations of the instrument. The
Counter self test tests the Counter memory, the Read/Write hardware control
registers, the analog front end, and a 2.5 MHz test signal. The query returns
pass/fail information. In a failed situation, additional failure information can be
obtained with the SYStem:ERRor? query.
N/A
TEST:ALL?
N/A
N/A
*TST?
Initiates the Counter self-test operation. If the test fails, an error message is
placed in the error queue and the error LED blinks. The self test tests the
following:
H Two 4 Kb Counter measurement buffers
H Logic registers
H Analog front end pre-amp offset, pre-amp inverter, and pre-amp gain digital
to analog converters (DACs)
H A 2.5 MHz signal is routed in through a test source and checked for accuracy
Command Response/Description
INST:SEL Counter Counter
TEST:ALL? “CTR: Self-Test Passed”
”CTR: Self-Test Failed
Initiates the Counter self test operation and returns either a
pass or failure message.
Command Syntax
Query Syntax
*RST Value
Limits
Related Commands
Query Response
Examples